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	SMV-2019-14: Morphological analysis of pyrolytical graphite in two crystallographic orientations for biophysics research Mika, Filip Development of a suitable methodology for specimen preparation and imaging of pyrolytic graphite flakes in a high-resolution SEM without the need for coating with a thin layer of metal, that is without losing detailed information about the morphology. Methodology for morphological analysis of flakes from very large fields of view up to the width of several centimeters. Detailed record
	Pozorování nevodivých nano-struktur v rastrovacím elektronovém mikroskopu Wandrol, Petr ; Mika, Filip This paper deals with the observation of the non-conductive samples in the scanning electron microscope by the method of the critical energy finding by the cathode lens system and by the low energy backscattered electron detector. Both methods are described in detail and their advantages are shown by imaging of various non-conductive samples. Detailed record
	Scanning electron microscopy with low energy electrons Mika, Filip A method of scanning electron microscopy (SEM) of nonconductive specimens, based on measurement and utilisation of the critical energy of electron impact, is described in detail together with examples of its application. The critical energy, at which the total electron yield curve crosses the unit level, is estimated on the base of measurement of the time development in the image signal from beginning of irradiation. The method is programmed and implemented as a module to the controlling software of the micropscope type VEGA, where it secures fast search for the critical energy value. Detailed record
	Scanning electron microscopy with low energy electrons Mika, Filip A method of scanning electron microscopy (SEM) of nonconductive specimens, based on measurement and utilisation of the critical energy of electron impact, is described in detail together with examples of its applications. The critical energy, at which the total electron yield curve crosses the unit level, is estimated on the base of measurement of the time development in the image signal from beginning of irradiation. The method is programmed and implemented as a module to the controlling software of the microscope type VEGA, where it secures fast search for the critical energy value. Detailed record
	SEM imaging of nonconductive powders at critical energy Zobačová, Jitka ; Zdražil, Josef ; Müllerová, Ilona ; Frank, Luděk As a rule, at electron energies normally used in SEM, the total electron yield is lower then 100% and some negative charge is dissipated in the specimen. This prevents observation of nonconductors in which the injected charge stays localized and its field destroys both geometry and brightness scale of the image. Detailed record

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